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Understanding TES Performance in Modified Bias Circuits for X-IFU Multiplexed Readout

A recent paper by Smith et al., “Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout,”has been accepted […]

Understanding TES Performance in Modified Bias Circuits for X-IFU Multiplexed Readout

A recent paper by Smith et al., “Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout,”has been accepted […]

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