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24 September 2020

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Understanding TES Performance in Modified Bias Circuits for X-IFU Multiplexed Readout

A recent paper by Smith et al., “Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout,”has been accepted for publication in the IEEE Transactions on Applied Superconductivity. The work addresses an important aspect of X-IFU detector readout: the impact of incorporating a bypass resistor into the bias circuit used for time-division multiplexing (TDM). […]

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