Understanding TES Performance in Modified Bias Circuits for X-IFU Multiplexed Readout
A recent paper by Smith et al., « Transition-edge sensor characteristics in a modified bias circuit for multiplexed readout, »has been accepted for publication in the IEEE Transactions on Applied Superconductivity. The work addresses an important aspect of X-IFU detector readout: the impact of incorporating a bypass resistor into the bias circuit used for time-division multiplexing (TDM). […]
